James Patrick Sharpe

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Lexington, KY, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for analyzing an electronics device including a l...
- Patent number 9,170,901
- Issue date Oct 27, 2015
- Lexmark International, Inc.
- James Ray Bailey
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit including a programmable logic analyzer with enh...
- Patent number 8,516,304
- Issue date Aug 20, 2013
- Lexmark International, Inc.
- James Ray Bailey
- G01 - MEASURING TESTING
Information Patent Grant
Method for tuning control signal associated with at least one memor...
- Patent number 8,254,189
- Issue date Aug 28, 2012
- Lexmark International, Inc.
- Nathan Wayne Foley
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit Including a Programmable Logic Analyzer with Enh...
- Publication number 20160282408
- Publication date Sep 29, 2016
- Lexmark International, Inc.
- Eric David Langevin
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Analyzing an Electronics Device Including a L...
- Publication number 20120144256
- Publication date Jun 7, 2012
- James Ray Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated Circuit Including a Programmable Logic Analyzer with Enh...
- Publication number 20110047427
- Publication date Feb 24, 2011
- James Ray Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Tuning Control Signal Associated with at Least One Memor...
- Publication number 20100277993
- Publication date Nov 4, 2010
- Nathan Wayne Foley
- G11 - INFORMATION STORAGE