James R. Clinton

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Seattle, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for displaying analog signatures of an electronic component
- Patent number 4,924,175
- Issue date May 8, 1990
- James R. Clinton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing, in-circuit, semiconductors shunted by a low...
- Patent number 4,386,317
- Issue date May 31, 1983
- Huntron Instruments, Inc.
- James R. Clinton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting electrical shorts in electronic circuits
- Patent number 4,362,987
- Issue date Dec 7, 1982
- Huntron Instruments, Inc.
- James R. Clinton
- G01 - MEASURING TESTING