James R. Culp

Person

Towson, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Design-rule checking for curvilinear device features
- Patent number 10,997,355
- Issue date May 4, 2021
- GLOBALFOUNDRIES U.S. INC.
- Ahmed Hassan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rule and process assumption co-optimization using feature-specific...
- Patent number 9,898,573
- Issue date Feb 20, 2018
- GLOBALFOUNDRIES Inc.
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor layout generation
- Patent number 9,836,570
- Issue date Dec 5, 2017
- GLOBALFOUNDRIES Inc.
- Atsushi Azuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hazard detection for asset management
- Patent number 9,633,258
- Issue date Apr 25, 2017
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,455,186
- Issue date Sep 27, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,406,560
- Issue date Aug 2, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,385,038
- Issue date Jul 5, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correcting for stress induced pattern shifts in semiconductor manuf...
- Patent number 9,311,443
- Issue date Apr 12, 2016
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Net-voltage-aware optical proximity correction (OPC)
- Patent number 9,311,442
- Issue date Apr 12, 2016
- GLOBALFOUNDRIES Inc.
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hazard detection for asset management
- Patent number 9,105,084
- Issue date Aug 11, 2015
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,076,847
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting chip alterations with light emission
- Patent number 9,075,106
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,997,028
- Issue date Mar 31, 2015
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Hazard detection for asset management
- Patent number 8,929,585
- Issue date Jan 6, 2015
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nitride etch for improved spacer uniformity
- Patent number 8,470,713
- Issue date Jun 25, 2013
- International Business Machines Corporation
- James A. Culp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical design system and method
- Patent number 8,473,885
- Issue date Jun 25, 2013
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Yield enhancement by multiplicate-layer-handling optical correction
- Patent number 8,458,625
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Pavan Y. Bashaboina
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,429,576
- Issue date Apr 23, 2013
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,418,087
- Issue date Apr 9, 2013
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for comparing lithographic processing conditions...
- Patent number 8,381,141
- Issue date Feb 19, 2013
- International Business Machines Corporation
- Stephen E. Fischer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of designing an integrated circuit based on a combination of...
- Patent number 8,347,260
- Issue date Jan 1, 2013
- International Business Machines Corporation
- Kerry Bernstein
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Circuit enhancement by multiplicate-layer-handling circuit simulation
- Patent number 8,347,259
- Issue date Jan 1, 2013
- International Business Machines Corporation
- Pavan Y. Bashaboina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization of long range variability
- Patent number 8,336,008
- Issue date Dec 18, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leakage aware design post-processing
- Patent number 8,302,068
- Issue date Oct 30, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for correcting systematic parametric variations o...
- Patent number 8,301,290
- Issue date Oct 30, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,239,790
- Issue date Aug 7, 2012
- International Business Machines Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Spacer linewidth control
- Patent number 8,232,215
- Issue date Jul 31, 2012
- International Business Machines Corporation
- James A. Culp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical design system and method
- Patent number 8,219,943
- Issue date Jul 10, 2012
- International Business Machines Corporation
- John M Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multilayer OPC for design aware manufacturing
- Patent number 8,214,770
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Maharaj Mukherjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,176,444
- Issue date May 8, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PARAMETERIZED CELL WITH MULTIPLE LAYOUT CONFIGURATION OPTIONS
- Publication number 20240273275
- Publication date Aug 15, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Manubhai Patel Jignesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-RULE CHECKING FOR CURVILINEAR DEVICE FEATURES
- Publication number 20210133293
- Publication date May 6, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Ahmed Hassan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR LAYOUT GENERATION
- Publication number 20170351799
- Publication date Dec 7, 2017
- GLOBALFOUNDRIES INC.
- Atsushi Azuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RULE AND PROCESS ASSUMPTION CO-OPTIMIZATION USING FEATURE-SPECIFIC...
- Publication number 20170228491
- Publication date Aug 10, 2017
- GLOBALFOUNDRIES INC.
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTING FOR STRESS INDUCED PATTERN SHIFTS IN SEMICONDUCTOR MANUF...
- Publication number 20150363536
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NET-VOLTAGE-AWARE OPTICAL PROXIMITY CORRECTION (OPC)
- Publication number 20150310155
- Publication date Oct 29, 2015
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255343
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255398
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255342
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HAZARD DETECTION FOR ASSET MANAGEMENT
- Publication number 20150235082
- Publication date Aug 20, 2015
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAZARD DETECTION FOR ASSET MANAGEMENT
- Publication number 20150015606
- Publication date Jan 15, 2015
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20140203435
- Publication date Jul 24, 2014
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20130238263
- Publication date Sep 12, 2013
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Application
YIELD ENHANCEMENT BY MULTIPLICATE-LAYER-HANDLING OPTICAL CORRECTION
- Publication number 20130031519
- Publication date Jan 31, 2013
- International Business Machines Corporation
- Pavan Y. Bashaboina
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20120227019
- Publication date Sep 6, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DESIGN SYSTEM AND METHOD
- Publication number 20120167029
- Publication date Jun 28, 2012
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NITRIDE ETCH FOR IMPROVED SPACER UNIFORMITY
- Publication number 20120149200
- Publication date Jun 14, 2012
- International Business Machines Corporation
- James A. Culp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...
- Publication number 20120144356
- Publication date Jun 7, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAZARD DETECTION FOR ASSET MANAGEMENT
- Publication number 20120134527
- Publication date May 31, 2012
- International Business Machines Corporation
- James R. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR COMPARING LITHOGRAPHIC PROCESSING CONDITIONS...
- Publication number 20120107969
- Publication date May 3, 2012
- International Business Machines Corporation
- Stephen E. Fischer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DESIGNING AN INTEGRATED CIRCUIT BASED ON A COMBINATION OF...
- Publication number 20120066657
- Publication date Mar 15, 2012
- International Business Machines Corporation
- Kerry Bernstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20110307846
- Publication date Dec 15, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEAKAGE AWARE DESIGN POST-PROCESSING
- Publication number 20110179391
- Publication date Jul 21, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED SENSITIVITY DEFINITION AND CALIBRATION FOR DESIGN FOR MAN...
- Publication number 20110166686
- Publication date Jul 7, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CORRECTING SYSTEMATIC PARAMETRIC VARIATIONS O...
- Publication number 20110098838
- Publication date Apr 28, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization of Long Range Variability
- Publication number 20110078641
- Publication date Mar 31, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND STRUCTURES FOR ENHANCING PERIMETER-TO-SURFACE AREA HOMO...
- Publication number 20110068436
- Publication date Mar 24, 2011
- International Business Machines Corporation
- James A. Culp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detecting Chip Alterations with Light Emission
- Publication number 20110026806
- Publication date Feb 3, 2011
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Multiple Induced Systematic and Statistical Layout Depend...
- Publication number 20100269079
- Publication date Oct 21, 2010
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spacer Linewidth Control
- Publication number 20100261351
- Publication date Oct 14, 2010
- International Business Machines Corporation
- James A. Culp
- H01 - BASIC ELECTRIC ELEMENTS

James R. Culp

Person

Patents Grantslast 30 patents

Design-rule checking for curvilinear device features

Rule and process assumption co-optimization using feature-specific...

Semiconductor layout generation

Hazard detection for asset management

Selective local metal cap layer formation for improved electromigra...

Selective local metal cap layer formation for improved electromigra...

Selective local metal cap layer formation for improved electromigra...

Correcting for stress induced pattern shifts in semiconductor manuf...

Net-voltage-aware optical proximity correction (OPC)

Hazard detection for asset management

Selective local metal cap layer formation for improved electromigra...

Detecting chip alterations with light emission

Methods and system for analysis and management of parametric yield

Hazard detection for asset management

Nitride etch for improved spacer uniformity

Physical design system and method

Yield enhancement by multiplicate-layer-handling optical correction

Methods and system for analysis and management of parametric yield

Analyzing multiple induced systematic and statistical layout depend...

Method and system for comparing lithographic processing conditions...

Method of designing an integrated circuit based on a combination of...

Circuit enhancement by multiplicate-layer-handling circuit simulation

Characterization of long range variability

Leakage aware design post-processing

System and method for correcting systematic parametric variations o...

Methods and system for analysis and management of parametric yield

Spacer linewidth control

Physical design system and method

Multilayer OPC for design aware manufacturing

Analyzing multiple induced systematic and statistical layout depend...

Patents Applicationslast 30 patents

PARAMETERIZED CELL WITH MULTIPLE LAYOUT CONFIGURATION OPTIONS

DESIGN-RULE CHECKING FOR CURVILINEAR DEVICE FEATURES

SEMICONDUCTOR LAYOUT GENERATION

RULE AND PROCESS ASSUMPTION CO-OPTIMIZATION USING FEATURE-SPECIFIC...

CORRECTING FOR STRESS INDUCED PATTERN SHIFTS IN SEMICONDUCTOR MANUF...

NET-VOLTAGE-AWARE OPTICAL PROXIMITY CORRECTION (OPC)

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

HAZARD DETECTION FOR ASSET MANAGEMENT

HAZARD DETECTION FOR ASSET MANAGEMENT

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

YIELD ENHANCEMENT BY MULTIPLICATE-LAYER-HANDLING OPTICAL CORRECTION

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

PHYSICAL DESIGN SYSTEM AND METHOD

NITRIDE ETCH FOR IMPROVED SPACER UNIFORMITY

ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...

HAZARD DETECTION FOR ASSET MANAGEMENT

METHOD AND SYSTEM FOR COMPARING LITHOGRAPHIC PROCESSING CONDITIONS...

METHOD OF DESIGNING AN INTEGRATED CIRCUIT BASED ON A COMBINATION OF...

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

LEAKAGE AWARE DESIGN POST-PROCESSING

AUTOMATED SENSITIVITY DEFINITION AND CALIBRATION FOR DESIGN FOR MAN...

SYSTEM AND METHOD FOR CORRECTING SYSTEMATIC PARAMETRIC VARIATIONS O...

Characterization of Long Range Variability

METHODS AND STRUCTURES FOR ENHANCING PERIMETER-TO-SURFACE AREA HOMO...

Detecting Chip Alterations with Light Emission

Analyzing Multiple Induced Systematic and Statistical Layout Depend...

Spacer Linewidth Control