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James R. Gaines
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Honolulu, HI, US
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last 30 patents
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Patent Grant
Stress induced voltage fluctuation for measuring stress and strain...
Patent number
6,134,971
Issue date
Oct 24, 2000
University of Hawaii
Anupam Misra
G01 - MEASURING TESTING
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Patent Grant
Low temperature (T lower than 950.degree. C.) preparation of melt t...
Patent number
5,591,698
Issue date
Jan 7, 1997
University of Hawaii
Steven Y. Song
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES