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James R. Melcher deceased
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late of Lexington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for obtaining increased sensitivity, selectivi...
Patent number
6,433,542
Issue date
Aug 13, 2002
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for obtaining increased sensitivity, selectiv...
Patent number
6,252,398
Issue date
Jun 26, 2001
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for obtaining increased sensitivity, selectiv...
Patent number
5,990,677
Issue date
Nov 23, 1999
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for obtaining increased sensitivity, selectiv...
Patent number
5,629,621
Issue date
May 13, 1997
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer having periodic winding structure and material propert...
Patent number
5,453,689
Issue date
Sep 26, 1995
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for measuring permeability and conductivity i...
Patent number
5,015,951
Issue date
May 14, 1991
Massachusetts Institute of Technology
James R. Melcher
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measurement of charge entrained in fluids
Patent number
4,873,489
Issue date
Oct 10, 1989
Massachusetts Institute of Technology
James R. Melcher
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for measuring permittivity in materials
Patent number
4,814,690
Issue date
Mar 21, 1989
Massachusetts Institute of Technology
James R. Melcher
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus and method for obtaining increased sensitivity, selectivi...
Publication number
20010054894
Publication date
Dec 27, 2001
Massachusetts Institute of Technology
Neil J. Goldfine
G01 - MEASURING TESTING