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James R. Wishard
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Granada Hills, CA, US
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last 30 patents
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Patent Grant
Method of sample preparation for atom probes and source of specimens
Patent number
7,098,454
Issue date
Aug 29, 2006
California Institute of Technology
Kimberly Kuhlman
G01 - MEASURING TESTING
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last 30 patents
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Method of sample preparation for atom probes and source of specimens
Publication number
20040056195
Publication date
Mar 25, 2004
Kimberly Kuhlman
G01 - MEASURING TESTING