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James Scott
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Beavercreek, OH, US
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last 30 patents
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Patent Grant
Defect detection systems and methods
Patent number
10,808,353
Issue date
Oct 20, 2020
Northrop Grumman Innovation Systems, Inc.
Nathan T. Green
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
DEFECT DETECTION SYSTEMS AND METHODS
Publication number
20190072500
Publication date
Mar 7, 2019
Orbital ATK, Inc.
Nathan T. Green
G01 - MEASURING TESTING