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James Sokolowsky
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Tomball, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Using near and far field ULF and ELF interferometry synthetic apert...
Patent number
10,254,428
Issue date
Apr 9, 2019
Deep Imaging Technologies, Inc.
James Sokolowsky
G01 - MEASURING TESTING
Information
Patent Grant
Method using near and far field ULF and ELF interferometry syntheti...
Patent number
9,638,826
Issue date
May 2, 2017
Deep Imaging Technologies Inc.
James Sokolowsky
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Using Near and Far Field ULF and ELF Interferometry Synthetic Apert...
Publication number
20170212267
Publication date
Jul 27, 2017
Deep Imaging Technologies, Inc.
James Sokolowsky
G01 - MEASURING TESTING
Information
Patent Application
System and Method Using Near and Far Field ULF and ELF Interferomet...
Publication number
20150123835
Publication date
May 7, 2015
Deep Imaging Technologies Inc.
James Sokolowsky
G01 - MEASURING TESTING