James Stolz

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for reducing stray laser light in particle sen...
- Patent number 6,072,187
- Issue date Jun 6, 2000
- Fisher Pierce Co.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and a method for dynamically tuning a particle sensor in...
- Patent number 5,424,558
- Issue date Jun 13, 1995
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,266,798
- Issue date Nov 30, 1993
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Method for synchronizing particle counters to external events
- Patent number 5,235,625
- Issue date Aug 10, 1993
- High Yield Technology
- James B. Stolz
- G01 - MEASURING TESTING
Information Patent Grant
Low cost stage for raster scanning of semiconductor wafers
- Patent number 5,212,580
- Issue date May 18, 1993
- High Yield Technology
- George L. Coad
- G02 - OPTICS
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,132,548
- Issue date Jul 21, 1992
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING