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James Sumit TANDON
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Detecting apparatus, wafer and electronic device
Patent number
9,466,540
Issue date
Oct 11, 2016
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
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Patent Grant
Measurement apparatus and electronic device
Patent number
9,057,745
Issue date
Jun 16, 2015
Advantest Corporation
Takahiro Yamaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DETECTING APPARATUS, WAFER AND ELECTRONIC DEVICE
Publication number
20140197846
Publication date
Jul 17, 2014
THE UNIVERSITY OF TOKYO
Takahiro YAMAGUCHI
G01 - MEASURING TESTING
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Patent Application
MEASUREMENT APPARATUS AND ELECTRONIC DEVICE
Publication number
20140184194
Publication date
Jul 3, 2014
THE UNIVERSITY OF TOKYO
Takahiro YAMAGUCHI
G01 - MEASURING TESTING