James V. Crain JR.

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Milton, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test and monitoring structure to detect boundaries of...
- Patent number 9,087,805
- Issue date Jul 21, 2015
- International Business Machines Corporation
- James V. Crain
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test and monitoring structure to detect boundaries of...
- Patent number 9,006,739
- Issue date Apr 14, 2015
- International Business Machines Corporation
- James V. Crain
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST AND MONITORING STRUCTURE TO DETECT BOUNDARIES OF...
- Publication number 20150044787
- Publication date Feb 12, 2015
- International Business Machines Corporation
- James V. Crain
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST AND MONITORING STRUCTURE TO DETECT BOUNDARIES OF...
- Publication number 20130270558
- Publication date Oct 17, 2013
- International Business Machines Corporation
- James V. Crain
- G01 - MEASURING TESTING
Information Patent Application
Packaging reliability superchips
- Publication number 20080088335
- Publication date Apr 17, 2008
- Jason E. Blanchet
- G01 - MEASURING TESTING
Information Patent Application
Packaging reliability super chips
- Publication number 20060290372
- Publication date Dec 28, 2006
- Jason E. Blanchet
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Chip Having A Ringed Wiring Layer Interposed Bet...
- Publication number 20050050505
- Publication date Mar 3, 2005
- International Business Machines Corporation
- Thomas R. Bednar
- H01 - BASIC ELECTRIC ELEMENTS