James W. Wilkinson

Person

  • Topsfield, MA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Ion beam measurement system and method

    • Patent number 8,698,108
    • Issue date Apr 15, 2014
    • Varian Semiconductor Equipment Associates, Inc.
    • Joseph P. Dzengeleski
    • H01 - BASIC ELECTRIC ELEMENTS