James Welch

Person

Clayton, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
High throughput chemical mechanical polishing composition for metal...
- Patent number 8,304,344
- Issue date Nov 6, 2012
- Advanced Technology Materials, Inc.
- Karl E. Boggs
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical vapor deposition of high conductivity, adherent thin films...
- Patent number 8,241,704
- Issue date Aug 14, 2012
- Advanced Technology Materials, Inc.
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 8,109,130
- Issue date Feb 7, 2012
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Chemical vapor deposition of high conductivity, adherent thin films...
- Patent number 8,034,407
- Issue date Oct 11, 2011
- Advanced Technology Materials, Inc.
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,475,588
- Issue date Jan 13, 2009
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor with attenuated drift characteristic
- Patent number 7,370,511
- Issue date May 13, 2008
- MST Technology GmbH
- Ing-Shin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Nickel-coated free-standing silicon carbide structure for sensing f...
- Patent number 7,296,458
- Issue date Nov 20, 2007
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,296,460
- Issue date Nov 20, 2007
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Chemical vapor deposition of high conductivity, adherent thin films...
- Patent number 7,285,308
- Issue date Oct 23, 2007
- Advanced Technology Materials, Inc.
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and process for sensing target gas species in semiconduct...
- Patent number 7,228,724
- Issue date Jun 12, 2007
- Advanced Technology Materials, Inc.
- Philip S. H. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,080,545
- Issue date Jul 25, 2006
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHEMICAL VAPOR DEPOSITION OF HIGH CONDUCTIVITY, ADHERENT THIN FILMS...
- Publication number 20110195188
- Publication date Aug 11, 2011
- Advanced Technology Materials, Inc.
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND PROCESS FOR SENSING FLUORO SPECIES IN SEMICONDUCTOR P...
- Publication number 20090305427
- Publication date Dec 10, 2009
- Advanced Technology Materials, Inc.
- Frank Dimeo, JR.
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CHEMICAL MECHANICAL POLISHING COMPOSITION AND PROCESS FO...
- Publication number 20090215269
- Publication date Aug 27, 2009
- Advanced Technology Materials Inc.
- Karl E. Boggs
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
HIGH THROUGHPUT CHEMICAL MECHANICAL POLISHING COMPOSITION FOR METAL...
- Publication number 20080254628
- Publication date Oct 16, 2008
- Advanced Technology Materials, Inc.
- Karl E. Boggs
- B24 - GRINDING POLISHING
Information Patent Application
Method And Apparatus For Monitoring Plasma Conditions In An Etching...
- Publication number 20080134757
- Publication date Jun 12, 2008
- Advanced Technology Materials, Inc.
- Ing-Shin Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CHEMICAL VAPOR DEPOSITION OF HIGH CONDUCTIVITY, ADHERENT THIN FILMS...
- Publication number 20070218205
- Publication date Sep 20, 2007
- Advanced Technology Materials, Inc.
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050230258
- Publication date Oct 20, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050205424
- Publication date Sep 22, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050199496
- Publication date Sep 15, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Chemical vapor deposition of high conductivity, adherent thin films...
- Publication number 20050186341
- Publication date Aug 25, 2005
- Bryan C. Hendrix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus and process for sensing target gas species in semiconduct...
- Publication number 20040187557
- Publication date Sep 30, 2004
- Philip S.H. Chen
- G01 - MEASURING TESTING
Information Patent Application
Nickel-coated free-standing silicon carbide structure for sensing f...
- Publication number 20040163444
- Publication date Aug 26, 2004
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20040163445
- Publication date Aug 26, 2004
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20040074285
- Publication date Apr 22, 2004
- Frank Dimeo
- G01 - MEASURING TESTING

James Welch

Person

Patents Grantslast 30 patents

High throughput chemical mechanical polishing composition for metal...

Chemical vapor deposition of high conductivity, adherent thin films...

Apparatus and process for sensing fluoro species in semiconductor p...

Chemical vapor deposition of high conductivity, adherent thin films...

Apparatus and process for sensing fluoro species in semiconductor p...

Gas sensor with attenuated drift characteristic

Nickel-coated free-standing silicon carbide structure for sensing f...

Apparatus and process for sensing fluoro species in semiconductor p...

Chemical vapor deposition of high conductivity, adherent thin films...

Apparatus and process for sensing target gas species in semiconduct...

Apparatus and process for sensing fluoro species in semiconductor p...

Patents Applicationslast 30 patents

CHEMICAL VAPOR DEPOSITION OF HIGH CONDUCTIVITY, ADHERENT THIN FILMS...

APPARATUS AND PROCESS FOR SENSING FLUORO SPECIES IN SEMICONDUCTOR P...

INTEGRATED CHEMICAL MECHANICAL POLISHING COMPOSITION AND PROCESS FO...

HIGH THROUGHPUT CHEMICAL MECHANICAL POLISHING COMPOSITION FOR METAL...

Method And Apparatus For Monitoring Plasma Conditions In An Etching...

CHEMICAL VAPOR DEPOSITION OF HIGH CONDUCTIVITY, ADHERENT THIN FILMS...

Apparatus and process for sensing fluoro species in semiconductor p...

Apparatus and process for sensing fluoro species in semiconductor p...

Apparatus and process for sensing fluoro species in semiconductor p...

Chemical vapor deposition of high conductivity, adherent thin films...

Apparatus and process for sensing target gas species in semiconduct...

Nickel-coated free-standing silicon carbide structure for sensing f...

Apparatus and process for sensing fluoro species in semiconductor p...

Apparatus and process for sensing fluoro species in semiconductor p...