James William Bice

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Wayne, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for the shunt calibration of semiconductor st...
- Patent number 4,414,837
- Issue date Nov 15, 1983
- Plevy; Arthur L.
- James W. Bice
- G01 - MEASURING TESTING
Information Patent Grant
Beam type transducers employing accurate, integral force limiting
- Patent number 3,970,982
- Issue date Jul 20, 1976
- Kulite Semiconductor Products, Inc.
- Anthony D. Kurtz
- G01 - MEASURING TESTING