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Jamie McCormack
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Eindhoven, NL
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last 30 patents
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Patent Grant
Method of imaging a specimen using a transmission charged particle...
Patent number
11,810,751
Issue date
Nov 7, 2023
FEI Company
Peter Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
EELS detection technique in an electron microscope
Patent number
10,832,901
Issue date
Nov 10, 2020
FEI Company
Bert Henning Freitag
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...
Publication number
20210407762
Publication date
Dec 30, 2021
FEI Company
Peter TIEMEIJER
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
Publication number
20190341243
Publication date
Nov 7, 2019
FEI Company
Bert Henning Freitag
H01 - BASIC ELECTRIC ELEMENTS