Jamie S. Cullen

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan stream sequencing for testing integrated circuits
- Patent number 7,454,678
- Issue date Nov 18, 2008
- Credence Systems Corporation
- Jamie S. Cullen
- G11 - INFORMATION STORAGE
Information Patent Grant
Tester system having a multi-purpose memory
- Patent number 7,171,598
- Issue date Jan 30, 2007
- Credence Systems Corporation
- Jamie S. Cullen
- G11 - INFORMATION STORAGE
Information Patent Grant
Tester system having multiple instruction memories
- Patent number 7,039,841
- Issue date May 2, 2006
- Credence Systems Corporation
- Jamie S. Cullen
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing with ring-connected test instrument modules
- Patent number 7,035,755
- Issue date Apr 25, 2006
- Credence Systems Corporation
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Scan stream sequencing for testing integrated circuits
- Patent number 6,748,564
- Issue date Jun 8, 2004
- NPTest, LLC
- Jamie S. Cullen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Scan stream sequencing for testing integrated circuits
- Publication number 20060005096
- Publication date Jan 5, 2006
- Jamie S. Cullen
- G01 - MEASURING TESTING
Information Patent Application
Scan stream sequencing for testing integrated circuits
- Publication number 20040255212
- Publication date Dec 16, 2004
- Jamie S. Cullen
- G01 - MEASURING TESTING
Information Patent Application
Tester system having multiple instruction memories
- Publication number 20040059437
- Publication date Mar 25, 2004
- Conduct Prosecution
- Jamie S. Cullen
- G01 - MEASURING TESTING
Information Patent Application
Tester system having a multi-purpose memory
- Publication number 20040039977
- Publication date Feb 26, 2004
- Jamie S. Cullen
- G01 - MEASURING TESTING
Information Patent Application
Circuit testing with ring-connected test instrument modules
- Publication number 20030105607
- Publication date Jun 5, 2003
- Michael F. Jones
- G01 - MEASURING TESTING