Jan Brian Wilstrup

Person

Mounds View, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Waveform analyzer
- Patent number 8,054,907
- Issue date Nov 8, 2011
- John David Hamre
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for clock recovery
- Patent number 7,688,927
- Issue date Mar 30, 2010
- Gigamax Technologies, Inc.
- Steven J. Fraasch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for analyzing a distribution
- Patent number 7,016,805
- Issue date Mar 21, 2006
- Wavecrest Corporation
- Jie Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining system response characteristics
- Patent number 6,813,589
- Issue date Nov 2, 2004
- Wavecrest Corporation
- Mike Peng Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,799,144
- Issue date Sep 28, 2004
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,449,570
- Issue date Sep 10, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system with a frequency-dividing edge counter
- Patent number 6,393,088
- Issue date May 21, 2002
- Wavecrest Corporation
- Mark J. Emineth
- G04 - HOROLOGY
Information Patent Grant
Method and apparatus for jitter analysis
- Patent number 6,356,850
- Issue date Mar 12, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,298,315
- Issue date Oct 2, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time interval measurement system incorporating a linear ramp genera...
- Patent number 6,194,925
- Issue date Feb 27, 2001
- Wavecrest Corporation
- Christopher Kimsal
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,185,509
- Issue date Feb 6, 2001
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test power supply
- Patent number 5,773,990
- Issue date Jun 30, 1998
- Megatest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
AC parametric circuit having adjustable delay lock loop
- Patent number 4,527,126
- Issue date Jul 2, 1985
- Micro Component Technology, Inc.
- Dennis M. Petrich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for clock recovery
- Publication number 20060193418
- Publication date Aug 31, 2006
- Steven J. Fraasch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Waveform analyzer
- Publication number 20060132116
- Publication date Jun 22, 2006
- John David Hamre
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20050027477
- Publication date Feb 3, 2005
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
N-dimensional determination of bit-error rates
- Publication number 20040243889
- Publication date Dec 2, 2004
- Peng Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electromagnetic and optical analyzer
- Publication number 20040001194
- Publication date Jan 1, 2004
- Wavecrest Corporation
- Jan Brian Wilstrup
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing a disribution
- Publication number 20030115017
- Publication date Jun 19, 2003
- Jie Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for determining system response characteristics
- Publication number 20030098696
- Publication date May 29, 2003
- Wavecrest Corporation
- Mike Peng Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for measuring a waveform
- Publication number 20030058970
- Publication date Mar 27, 2003
- John David Hamre
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for jitter analysis
- Publication number 20020120420
- Publication date Aug 29, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20010044704
- Publication date Nov 22, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Time interval measurement system incorporating a linear ramp genera...
- Publication number 20010028262
- Publication date Oct 11, 2001
- Wavecrest Corporation
- Christopher Kimsal
- G01 - MEASURING TESTING

Jan Brian Wilstrup

Person

Patents Grantslast 30 patents

Waveform analyzer

Method and apparatus for clock recovery

Method and apparatus for analyzing a distribution

Method and apparatus for determining system response characteristics

Method and apparatus for analyzing measurements

Analysis of noise in repetitive waveforms

Measurement system with a frequency-dividing edge counter

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements

Time interval measurement system incorporating a linear ramp genera...

Analysis of noise in repetitive waveforms

Integrated circuit test power supply

AC parametric circuit having adjustable delay lock loop

Patents Applicationslast 30 patents

Method and apparatus for clock recovery

Waveform analyzer

Method and apparatus for analyzing measurements

N-dimensional determination of bit-error rates

Electromagnetic and optical analyzer

Method and apparatus for analyzing a disribution

Method and apparatus for determining system response characteristics

Method and apparatus for measuring a waveform

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements

Time interval measurement system incorporating a linear ramp genera...