Jan-Hau Chang

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Hsinchu, TW

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Patents Applicationslast 30 patents

Information Patent Application
INSTRUMENTAL ERROR TRACKING AND IDENTIFICATION METHOD, INSTRUMENTAL...
- Publication number 20250237548
- Publication date Jul 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- JAN HAU CHANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR METROLOGY SYSTEM AND METHOD
- Publication number 20240193473
- Publication date Jun 13, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yun-Chung Teng
- G06 - COMPUTING CALCULATING COUNTING