Jan Klusácek

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for component analysis of spectral data
- Patent number 11,373,839
- Issue date Jun 28, 2022
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,327,032
- Issue date May 10, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
Method for Beam Interference Compensation Based on Computer Vision
- Publication number 20230335371
- Publication date Oct 19, 2023
- FEI Company
- Lukáš Malý
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220065804
- Publication date Mar 3, 2022
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20210033548
- Publication date Feb 4, 2021
- FEI Company
- Tomás Tuma
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200393392
- Publication date Dec 17, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200363349
- Publication date Nov 19, 2020
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING

Jan Klusácek

Person

Patents Grantslast 30 patents

Method of examining a sample using a charged particle beam apparatus

Method and system for determining sample composition from spectral...

Method of examining a sample using a charged particle microscope

Method of examining a sample using a charged particle microscope

Method and system for component analysis of spectral data

Method of examining a sample using a charged particle microscope

Patents Applicationslast 30 patents

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

Method for Beam Interference Compensation Based on Computer Vision

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE