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Jan Konijn
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
MRI apparatus with means for noise reduction
Patent number
7,304,477
Issue date
Dec 4, 2007
Koninklijke Philips Electronics N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Grant
MRI apparatus
Patent number
6,822,452
Issue date
Nov 23, 2004
Koninklijke Philips Electronics N.V.
Cornelis Leonardus Gerardus Ham
G01 - MEASURING TESTING
Information
Patent Grant
Coil system
Patent number
6,696,837
Issue date
Feb 24, 2004
Koninklijke Philips Electronics N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance apparatus with an optimized detection field
Patent number
5,019,778
Issue date
May 28, 1991
U.S. Philips Corporation
Wilhelmus R. M. Mens
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESSERAL SHIM COIL FOR A MAGNETIC RESONANCE SYSTEM
Publication number
20120098541
Publication date
Apr 26, 2012
Koninklijke Philips Electronics N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING SYSTEM WITH SATELLITE GRADIENT COILS
Publication number
20110227573
Publication date
Sep 22, 2011
Koninklijke Philips Electronics N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Application
Mri apparatus with means for noise reduction
Publication number
20070080689
Publication date
Apr 12, 2007
Koninklijke Philips Electronics N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Application
Coil system
Publication number
20030052680
Publication date
Mar 20, 2003
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Application
MRI apparatus
Publication number
20020079897
Publication date
Jun 27, 2002
Cornelis Leonardus Gerardus Ham
G01 - MEASURING TESTING