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Jan Lee Van Sickle
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Denver, CO, US
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Patents Grants
last 30 patents
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Patent Grant
Automatic feature extraction from imagery
Patent number
11,657,072
Issue date
May 23, 2023
HERE Global B.V.
Jan Van Sickle
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Open-ditch pipeline as-built process
Patent number
9,230,453
Issue date
Jan 5, 2016
Jan Lee Van Sickle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD, APPARATUS, AND SYSTEM FOR MAINTAINING MAP ACCURACY
Publication number
20230062890
Publication date
Mar 2, 2023
HERE Global B.V.
Jan VAN SICKLE
B60 - VEHICLES IN GENERAL
Information
Patent Application
METHOD, APPARATUS, AND SYSTEM FOR PROVIDING INCREASED ACCURACY FOR...
Publication number
20230059402
Publication date
Feb 23, 2023
HERE Global B.V.
Jan VAN SICKLE
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC FEATURE EXTRACTION FROM IMAGERY
Publication number
20200364247
Publication date
Nov 19, 2020
HERE Global B.V.
Jan Van Sickle
G05 - CONTROLLING REGULATING
Information
Patent Application
Open-Ditch Pipeline As-Built Process
Publication number
20140346223
Publication date
Nov 27, 2014
Jan Lee Van Sickle
G01 - MEASURING TESTING