Jan Liesener

Person

Middletown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometric lens aligner and method
- Patent number 12,292,274
- Issue date May 6, 2025
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems having at least partially overlappi...
- Patent number 10,066,974
- Issue date Sep 4, 2018
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoders using spectral analysis
- Patent number 9,891,078
- Issue date Feb 13, 2018
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Measuring topography of aspheric and other non-flat surfaces
- Patent number 9,798,130
- Issue date Oct 24, 2017
- Zygo Corporation
- Thomas Dresel
- G02 - OPTICS
Information Patent Grant
Double pass interferometric encoder system
- Patent number 9,746,348
- Issue date Aug 29, 2017
- Zygo Corporation
- Peter J. de Groot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometer with real-time fringe-free imaging
- Patent number 9,719,777
- Issue date Aug 1, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Compact encoder head for interferometric encoder system
- Patent number 9,201,313
- Issue date Dec 1, 2015
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Position monitoring system with reduced noise
- Patent number 9,115,975
- Issue date Aug 25, 2015
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometric encoder system
- Patent number 9,025,161
- Issue date May 5, 2015
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometric encoder system
- Patent number 8,941,842
- Issue date Jan 27, 2015
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometry with scan error correction
- Patent number 8,902,431
- Issue date Dec 2, 2014
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric methods for metrology of surfaces, films and underr...
- Patent number 8,854,628
- Issue date Oct 7, 2014
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of changes in surfaces of objects
- Patent number 8,456,644
- Issue date Jun 4, 2013
- Zygo Corporation
- Christopher J. Evans
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-based interferometer system for monitoring an imaging interfe...
- Patent number 8,379,218
- Issue date Feb 19, 2013
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for overlay measurements
- Patent number 8,248,617
- Issue date Aug 21, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining overlay errors
- Patent number 8,189,202
- Issue date May 29, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric systems and methods featuring spectral analysis of...
- Patent number 8,120,781
- Issue date Feb 21, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Scan error correction in low coherence scanning interferometry
- Patent number 8,004,688
- Issue date Aug 23, 2011
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Compound reference interferometer
- Patent number 7,978,338
- Issue date Jul 12, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interference objective for annular test surfaces
- Patent number 7,751,064
- Issue date Jul 6, 2010
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC LENS ALIGNER AND METHOD
- Publication number 20230031531
- Publication date Feb 2, 2023
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20160102999
- Publication date Apr 14, 2016
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODERS USING SPECTRAL ANALYSIS
- Publication number 20160011016
- Publication date Jan 14, 2016
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM
- Publication number 20150292913
- Publication date Oct 15, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
Measuring Topography of Aspheric and Other Non-Flat Surfaces
- Publication number 20150192769
- Publication date Jul 9, 2015
- Zygo Corporation
- Thomas Dresel
- G02 - OPTICS
Information Patent Application
POSITION MONITORING SYSTEM WITH REDUCED NOISE
- Publication number 20140098375
- Publication date Apr 10, 2014
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION
- Publication number 20130155413
- Publication date Jun 20, 2013
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM
- Publication number 20130114061
- Publication date May 9, 2013
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
COMPACT ENCODER HEAD FOR INTERFEROMETRIC ENCODER SYSTEM
- Publication number 20130114062
- Publication date May 9, 2013
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRU...
- Publication number 20120224183
- Publication date Sep 6, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...
- Publication number 20120089365
- Publication date Apr 12, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...
- Publication number 20120069326
- Publication date Mar 22, 2012
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
Measurement of Changes in Surfaces of Objects
- Publication number 20110051147
- Publication date Mar 3, 2011
- Zygo Corporation
- Christopher J. Evans
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR DETERMINING OVERLAY ERRORS
- Publication number 20110032535
- Publication date Feb 10, 2011
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND REFERENCE INTERFEROMETER
- Publication number 20100128276
- Publication date May 27, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...
- Publication number 20100128278
- Publication date May 27, 2010
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY
- Publication number 20100128280
- Publication date May 27, 2010
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...
- Publication number 20100128283
- Publication date May 27, 2010
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR OVERLAY MEASUREMENTS
- Publication number 20090262362
- Publication date Oct 22, 2009
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE OBJECTIVE FOR ANNULAR TEST SURFACES
- Publication number 20090185195
- Publication date Jul 23, 2009
- Jan Liesener
- G01 - MEASURING TESTING

Jan Liesener

Person

Patents Grantslast 30 patents

Interferometric lens aligner and method

Interferometric encoder systems having at least partially overlappi...

Interferometric encoders using spectral analysis

Measuring topography of aspheric and other non-flat surfaces

Double pass interferometric encoder system

Interferometer with real-time fringe-free imaging

Compact encoder head for interferometric encoder system

Position monitoring system with reduced noise

Double pass interferometric encoder system

Double pass interferometric encoder system

Low coherence interferometry with scan error correction

Interferometric methods for metrology of surfaces, films and underr...

Measurement of changes in surfaces of objects

Fiber-based interferometer system for monitoring an imaging interfe...

Interferometer for overlay measurements

Interferometer for determining overlay errors

Interferometric systems and methods featuring spectral analysis of...

Scan error correction in low coherence scanning interferometry

Compound reference interferometer

Interference objective for annular test surfaces

Patents Applicationslast 30 patents

INTERFEROMETRIC LENS ALIGNER AND METHOD

INTERFEROMETRIC ENCODER SYSTEMS

INTERFEROMETRIC ENCODERS USING SPECTRAL ANALYSIS

DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM

Measuring Topography of Aspheric and Other Non-Flat Surfaces

POSITION MONITORING SYSTEM WITH REDUCED NOISE

LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION

DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM

COMPACT ENCODER HEAD FOR INTERFEROMETRIC ENCODER SYSTEM

INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRU...

DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...

INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...

Measurement of Changes in Surfaces of Objects

INTERFEROMETER FOR DETERMINING OVERLAY ERRORS

COMPOUND REFERENCE INTERFEROMETER

FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...

SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY

INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...

INTERFEROMETER FOR OVERLAY MEASUREMENTS

INTERFERENCE OBJECTIVE FOR ANNULAR TEST SURFACES