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Jan Mehner
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Neukirchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Inertial sensor and method of levitation effect compensation
Patent number
9,335,170
Issue date
May 10, 2016
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical sensor having a bandpass characteristic
Patent number
8,746,064
Issue date
Jun 10, 2014
Fibercheck GmbH
Marco Dienel
G01 - MEASURING TESTING
Information
Patent Grant
Vibration measuring system
Patent number
7,819,012
Issue date
Oct 26, 2010
Siemens Aktiengesellschaft
Jan Mehner
G01 - MEASURING TESTING
Information
Patent Grant
Resonance scanner
Patent number
6,975,442
Issue date
Dec 13, 2005
Jenoptik LDT GmbH
Thomas Gessner
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
INERTIAL SENSOR AND METHOD OF LEVITATION EFFECT COMPENSATION
Publication number
20140144231
Publication date
May 29, 2014
Freescale Semiconductor, Inc.
Yizhen Lin
G01 - MEASURING TESTING
Information
Patent Application
SPRING FOR MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICE
Publication number
20140144232
Publication date
May 29, 2014
Yizhen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL SENSOR HAVING A BANDPASS CHARACTERISTIC
Publication number
20120048022
Publication date
Mar 1, 2012
TECHNISCHE UNIVERSITAET CHEMNITZ
Marco Dienel
G01 - MEASURING TESTING
Information
Patent Application
GENERATOR FOR GENERATING ELETRICAL ENERGY FROM MECHANICAL VIBRATION...
Publication number
20110221192
Publication date
Sep 15, 2011
Siemens Aktiengesellschaft
Jens Makuth
F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information
Patent Application
Vibration Measuring System
Publication number
20080196503
Publication date
Aug 21, 2008
Jens Makuth
G01 - MEASURING TESTING
Information
Patent Application
Resonance scanner
Publication number
20040130765
Publication date
Jul 8, 2004
Thomas Gessner
B81 - MICRO-STRUCTURAL TECHNOLOGY