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Jan Noworolski
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San Francisco, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Single crystal silicon sensor with high aspect ratio and curvilinea...
Patent number
6,316,796
Issue date
Nov 13, 2001
Lucas NovaSensor
Kurt E. Petersen
G01 - MEASURING TESTING
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Patent Grant
Single crystal silicon sensor with high aspect ratio and curvilinea...
Patent number
6,084,257
Issue date
Jul 4, 2000
Lucas NovaSensor
Kurt E. Petersen
G01 - MEASURING TESTING
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Patent Grant
Multi-cell battery monitoring system with single sensor wire
Patent number
5,546,003
Issue date
Aug 13, 1996
Polytronics Engineering Ltd.
Zbigniew Noworolski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Single crystal silicon sensor with high aspect ratio and curvilinea...
Publication number
20030205739
Publication date
Nov 6, 2003
Kurt E. Petersen
G01 - MEASURING TESTING
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Patent Application
Single crystal silicon sensor with high aspect ratio and curvilinea...
Publication number
20010020726
Publication date
Sep 13, 2001
Kurt Peterson
G01 - MEASURING TESTING