Jan-Patrick Schultheis

Person

Kirchheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating a setup
- Patent number 11,428,770
- Issue date Aug 30, 2022
- Rohde & Schwarz GmbH & Co. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of absolute phase calibration as well as calibration system
- Patent number 11,280,871
- Issue date Mar 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting an analyzer for testing a device under test
- Patent number 11,187,736
- Issue date Nov 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a measurement and analyzing device as well as...
- Patent number 11,054,450
- Issue date Jul 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Werner Held
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement method and device with compensation for a shifting freq...
- Patent number 10,996,264
- Issue date May 4, 2021
- Rohde & Schwarz GmbH & Co. KG
- Walter Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Signal source, test system and method for testing a device under test
- Patent number 10,890,609
- Issue date Jan 12, 2021
- Rohde & Schwarz GmbH & Co. KG
- Jan-Patrick Schultheis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of measuring the AM/PM conversion of a device under test
- Patent number 10,768,215
- Issue date Sep 8, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Leibfritz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST
- Publication number 20250027986
- Publication date Jan 23, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Thorsten LUECK
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING A SETUP
- Publication number 20210302526
- Publication date Sep 30, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SETTING AN ANALYZER FOR TESTING A DEVICE UNDER TEST
- Publication number 20210263088
- Publication date Aug 26, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ABSOLUTE PHASE CALIBRATION AS WELL AS CALIBRATION SYSTEM
- Publication number 20210181289
- Publication date Jun 17, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING A MEASUREMENT AND ANALYZING DEVICE AS WELL AS...
- Publication number 20210018545
- Publication date Jan 21, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND DEVICE WITH COMPENSATION FOR A SHIFTING FREQ...
- Publication number 20200174061
- Publication date Jun 4, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Walter WEISS
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL SOURCE, TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20200116771
- Publication date Apr 16, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Jan-Patrick Schultheis
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING THE AM/PM CONVERSION OF A DEVICE UNDER TEST
- Publication number 20200110118
- Publication date Apr 9, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Martin Leibfritz
- G01 - MEASURING TESTING

Jan-Patrick Schultheis

Person

Patents Grantslast 30 patents

Method of calibrating a setup

Method of absolute phase calibration as well as calibration system

Method of setting an analyzer for testing a device under test

Method of calibrating a measurement and analyzing device as well as...

Measurement method and device with compensation for a shifting freq...

Signal source, test system and method for testing a device under test

Method of measuring the AM/PM conversion of a device under test

Patents Applicationslast 30 patents

MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST

METHOD OF CALIBRATING A SETUP

METHOD OF SETTING AN ANALYZER FOR TESTING A DEVICE UNDER TEST

METHOD OF ABSOLUTE PHASE CALIBRATION AS WELL AS CALIBRATION SYSTEM

METHOD OF CALIBRATING A MEASUREMENT AND ANALYZING DEVICE AS WELL AS...

MEASUREMENT METHOD AND DEVICE WITH COMPENSATION FOR A SHIFTING FREQ...

SIGNAL SOURCE, TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST

METHOD OF MEASURING THE AM/PM CONVERSION OF A DEVICE UNDER TEST