Jan-Shian Shiao

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Tianjung Jen, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and system of testing a chip
- Patent number 6,483,338
- Issue date Nov 19, 2002
- VIA Technologies, Inc.
- Chih-Hsien Weng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system of testing a chip
- Publication number 20010050575
- Publication date Dec 13, 2001
- Chih-Hsien Weng
- G01 - MEASURING TESTING