Jan Stopka

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Method to correct first order astigmatism and first order distortio...
- Patent number 12,106,933
- Issue date Oct 1, 2024
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for aligning a multi-beam system
- Patent number 12,057,287
- Issue date Aug 6, 2024
- Jan Stopka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,676,795
- Issue date Jun 13, 2023
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC LENSES, CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE...
- Publication number 20250006453
- Publication date Jan 2, 2025
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ALIGNING A MULTI-BEAM SYSTEM
- Publication number 20230317405
- Publication date Oct 5, 2023
- FEI Company
- Jan STOPKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING BEAM POSITION
- Publication number 20230206489
- Publication date Jun 29, 2023
- FEI Company
- Jan STOPKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CORRECT FIRST ORDER ASTIGMATISM AND FIRST ORDER DISTORTIO...
- Publication number 20220328284
- Publication date Oct 13, 2022
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20210296088
- Publication date Sep 23, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS