Jan Trojek

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Brno, CZ

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Patents Applicationslast 30 patents

Information Patent Application
IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME
- Publication number 20250231130
- Publication date Jul 17, 2025
- FEI Company
- Jan Trojek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS