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Jan VAN DER KRUK
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LR Vaals, NL
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last 30 patents
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Patent Grant
Calibration method for electromagnetic induction measurement system...
Patent number
10,901,107
Issue date
Jan 26, 2021
Forschungszentrum Juelich GmbH
Xihe Tan
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
INDUCTIVE MEASURING APPARATUS AND CALIBRATION DEVICE AND METHOD
Publication number
20220128500
Publication date
Apr 28, 2022
FORSCHUNGSZENTRUM JULICH GmbH
Xihe Tan
G01 - MEASURING TESTING
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Patent Application
CALIBRATION METHOD FOR ELECTROMAGNETIC INDUCTION MEASUREMENT SYSTEM...
Publication number
20190265379
Publication date
Aug 29, 2019
FORSCHUNGSZENTRUM JUELICH GMBH
Xihe TAN
G01 - MEASURING TESTING