Jan Verspecht

Person

Steenhuffel, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Phase distortion measurement
- Patent number 12,158,491
- Issue date Dec 3, 2024
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing non-linear distortion
- Patent number 11,137,445
- Issue date Oct 5, 2021
- Keysight Technologies, Inc.
- Jan Verspecht
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement of periodically modulated signals under non-coherent op...
- Patent number 11,057,256
- Issue date Jul 6, 2021
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Nonlinear distortion detection
- Patent number 10,845,401
- Issue date Nov 24, 2020
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for characterizing, modeling and simulating non-l...
- Patent number 10,387,592
- Issue date Aug 20, 2019
- Keysight Technologies, Inc.
- Jan Verspecht
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system of preventing interference caused by images
- Patent number 10,003,419
- Issue date Jun 19, 2018
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for spectral stitching discontinuous spectra u...
- Patent number 9,698,919
- Issue date Jul 4, 2017
- Keysight Technologies, Inc.
- Troels Studsgaard Nielsen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for spectral stitching using reference channel...
- Patent number 9,673,914
- Issue date Jun 6, 2017
- Keysight Technologies, Inc.
- Troels Studsgaard Nielsen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for characterizing phase dispersion in intermedia...
- Patent number 9,520,954
- Issue date Dec 13, 2016
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of measuring full spectrum of modulated output si...
- Patent number 9,252,895
- Issue date Feb 2, 2016
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for predistorting signals for non-linear components in the p...
- Patent number 8,914,271
- Issue date Dec 16, 2014
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for generating a circuit model
- Patent number 7,295,961
- Issue date Nov 13, 2007
- Agilent Technologies, Inc.
- David E. Root
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and an apparatus for characterizing a high-frequency device-...
- Patent number 7,282,926
- Issue date Oct 16, 2007
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method to measure the mutual phase relationship of a set of spectra...
- Patent number 7,268,530
- Issue date Sep 11, 2007
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing high-frequency mixers
- Patent number 7,231,311
- Issue date Jun 12, 2007
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method and a test setup for measuring large-signal S-parameters tha...
- Patent number 7,038,468
- Issue date May 2, 2006
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method of and an apparatus for collecting RF input and output and b...
- Patent number 6,943,561
- Issue date Sep 13, 2005
- Agilent Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Providing controllable impedance at a reference plane in a circuit
- Patent number 6,930,564
- Issue date Aug 16, 2005
- Agilent Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Method of and an arrangement for characterizing non-linear behavior...
- Patent number 6,839,657
- Issue date Jan 4, 2005
- Agilent Technologies, Inc.
- Frans Verbeyst
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for collecting signal measurement data at signal ports of...
- Patent number 6,812,714
- Issue date Nov 2, 2004
- Agilent Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NONLINEAR DISTORTION DETECTION
- Publication number 20190064236
- Publication date Feb 28, 2019
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL STITCHING DISCONTINUOUS SPECTRA U...
- Publication number 20170187475
- Publication date Jun 29, 2017
- Keysight Technologies, Inc.
- Troels Studsgaard Nielsen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL STITCHING USING REFERENCE CHANNEL...
- Publication number 20170047915
- Publication date Feb 16, 2017
- Keysight Technologies, Inc.
- Troels Studsgaard Nielsen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL STITCHING USING REFERENCE CHANNEL...
- Publication number 20170048006
- Publication date Feb 16, 2017
- Keysight Technologies, Inc.
- Troels Studsgaard Nielsen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD OF MEASURING FULL SPECTRUM OF MODULATED OUTPUT SI...
- Publication number 20160028498
- Publication date Jan 28, 2016
- Keysight Technologies, Inc.
- Jan Verspecht
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR PREDISTORTING SIGNALS FOR NON-LINEAR COMPONENTS IN THE P...
- Publication number 20130138416
- Publication date May 30, 2013
- AGILENT TECHNOLOGIES, INC.
- Jan VERSPECHT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for Calibrating a Real-Time Load-Pull System
- Publication number 20090174415
- Publication date Jul 9, 2009
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
MEASURE THE MUTUAL PHASE RELATIONSHIP OF A SET OF SPECTRAL COMPONEN...
- Publication number 20070216394
- Publication date Sep 20, 2007
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Method and an apparatus for measuring high-frequency intermodulatio...
- Publication number 20060235638
- Publication date Oct 19, 2006
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Method for generating a circuit model
- Publication number 20050102124
- Publication date May 12, 2005
- David E. Root
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and a test setup for measuring large-signal S-parameters
- Publication number 20040257092
- Publication date Dec 23, 2004
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Providing controllable impedance at a reference plane in a circuit
- Publication number 20040085136
- Publication date May 6, 2004
- AGILENT TECHNOLOGIES, INC.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Method of and an apparatus for collecting RF input and output and b...
- Publication number 20030057964
- Publication date Mar 27, 2003
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for collecting signal measurement data at signal ports of...
- Publication number 20030058058
- Publication date Mar 27, 2003
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Application
Method of and an arrangement for characterizing non-linear behavior...
- Publication number 20030057963
- Publication date Mar 27, 2003
- Frans Verbeyst
- G01 - MEASURING TESTING

Jan Verspecht

Person

Patents Grantslast 30 patents

Phase distortion measurement

Method and apparatus for reducing non-linear distortion

Measurement of periodically modulated signals under non-coherent op...

Nonlinear distortion detection

Method and system for characterizing, modeling and simulating non-l...

Method and system of preventing interference caused by images

Method and apparatus for spectral stitching discontinuous spectra u...

Method and apparatus for spectral stitching using reference channel...

Method and system for characterizing phase dispersion in intermedia...

System and method of measuring full spectrum of modulated output si...

Method for predistorting signals for non-linear components in the p...

Method for generating a circuit model

Method and an apparatus for characterizing a high-frequency device-...

Method to measure the mutual phase relationship of a set of spectra...

Method for characterizing high-frequency mixers

Method and a test setup for measuring large-signal S-parameters tha...

Method of and an apparatus for collecting RF input and output and b...

Providing controllable impedance at a reference plane in a circuit

Method of and an arrangement for characterizing non-linear behavior...

Apparatus for collecting signal measurement data at signal ports of...

Patents Applicationslast 30 patents

NONLINEAR DISTORTION DETECTION

METHOD AND APPARATUS FOR SPECTRAL STITCHING DISCONTINUOUS SPECTRA U...

METHOD AND APPARATUS FOR SPECTRAL STITCHING USING REFERENCE CHANNEL...

METHOD AND APPARATUS FOR SPECTRAL STITCHING USING REFERENCE CHANNEL...

SYSTEM AND METHOD OF MEASURING FULL SPECTRUM OF MODULATED OUTPUT SI...

METHOD FOR PREDISTORTING SIGNALS FOR NON-LINEAR COMPONENTS IN THE P...

Method for Calibrating a Real-Time Load-Pull System

MEASURE THE MUTUAL PHASE RELATIONSHIP OF A SET OF SPECTRAL COMPONEN...

Method and an apparatus for measuring high-frequency intermodulatio...

Method for generating a circuit model

Method and a test setup for measuring large-signal S-parameters

Providing controllable impedance at a reference plane in a circuit

Method of and an apparatus for collecting RF input and output and b...

Apparatus for collecting signal measurement data at signal ports of...

Method of and an arrangement for characterizing non-linear behavior...