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Jan Willem DE WIT
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Deventer, NL
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Patents Grants
last 30 patents
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Patent Grant
Device and a method for light-based analysis of a substance in a li...
Patent number
12,181,407
Issue date
Dec 31, 2024
Stichting IMEC Nederland
Joris Van Nieuwstadt
G01 - MEASURING TESTING
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Patent Grant
Device and a method for light-based analysis of a substance in a li...
Patent number
12,130,229
Issue date
Oct 29, 2024
Stichting IMEC Nederland
Joris Van Nieuwstadt
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Patents Applications
last 30 patents
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Patent Application
Device and Method for Dielectric Material Characterization
Publication number
20240035987
Publication date
Feb 1, 2024
Stichting IMEC Nederland
Rahul Yadav
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
DEVICE AND A METHOD FOR LIGHT-BASED ANALYSIS OF A SUBSTANCE IN A LI...
Publication number
20220299435
Publication date
Sep 22, 2022
Stichting IMEC Nederland
Joris VAN NIEUWSTADT
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND A METHOD FOR LIGHT-BASED ANALYSIS OF A SUBSTANCE IN A LI...
Publication number
20220299430
Publication date
Sep 22, 2022
Stichting IMEC Nederland
Joris VAN NIEUWSTADT
G01 - MEASURING TESTING