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Jan-Willem van de Waerdt
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San Jose, CA, US
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last 30 patents
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Patent Grant
Hardware de-convolution block for multi-phase scanning
Patent number
9,377,493
Issue date
Jun 28, 2016
PARADE TECHNOLOGIES, LTD.
Aaron Hogan
G01 - MEASURING TESTING
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Patent Grant
Hardware de-convolution block for multi-phase scanning
Patent number
8,860,682
Issue date
Oct 14, 2014
Cypress Semiconductor Corporation
Viktor Kremin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
HARDWARE DE-CONVOLUTION BLOCK FOR MULTI-PHASE SCANNING
Publication number
20160041210
Publication date
Feb 11, 2016
Parade Technologies, Ltd.
Aaron Hogan
G01 - MEASURING TESTING
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Patent Application
HARDWARE DE-CONVOLUTION BLOCK FOR MULTI-PHASE SCANNING
Publication number
20140316729
Publication date
Oct 23, 2014
CYPRESS SEMICONDUCTOR CORPORATION
Viktor Kremin
G01 - MEASURING TESTING