Fremont, CA, US
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Patent Grant
Xilinx, Inc.
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G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
Jing Jing
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Xilinx, Inc.
Jane W. Sowards
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Jung-Ching J. Ho
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Xilinx, Inc.
Peter Rabkin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Jonathan J. Ho
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
David P. Schultz
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Stephen M. Douglass
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Raymond C. Pang
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Raymond C. Pang
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Xilinx, Inc.
Steven P. Young
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Xilinx, Inc.
Jing JING
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Xilinx, Inc.
Andy WIDJAJA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Xilinx, Inc.
Albert Shih-Huai LIN
G01 - MEASURING TESTING
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Patent Application
Xilinx, Inc.
Jing Jing
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Xilinx, Inc.
Jung-Ching J. Ho
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Xilinx, Inc.
David P. Schultz
G06 - COMPUTING CALCULATING COUNTING
