Jang-Ho Shin

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for preprocessing security log
- Patent number 11,790,252
- Issue date Oct 17, 2023
- SAMSUNG SDS CO., LTD.
- Jang-Ho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having overlay measurement mark and method of...
- Patent number 7,582,899
- Issue date Sep 1, 2009
- Samsung Electronics Co., Ltd.
- Cha-Won Koh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photomask for measuring lens aberration, method of its manufacture,...
- Patent number 7,403,276
- Issue date Jul 22, 2008
- Samsung Electronics Co., Ltd.
- Jang-Ho Shin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR GENERATING SUMMARY OF URL FOR URL CLUSTERING
- Publication number 20210136032
- Publication date May 6, 2021
- SAMSUNG SDS CO., LTD.
- Jang Ho KIM
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR MACHINE LEARNING OF MALICIOUS CODE DETECTING MODEL AND M...
- Publication number 20210133323
- Publication date May 6, 2021
- SAMSUNG SDS CO., LTD.
- Jang Mi SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR PREPROCESSING SECURITY LOG
- Publication number 20200134487
- Publication date Apr 30, 2020
- SAMSUNG SDS CO., LTD.
- Jang-Ho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MARK OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE INCLU...
- Publication number 20080230929
- Publication date Sep 25, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Jang-ho Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photomask for measuring lens aberration, method of its manufacture,...
- Publication number 20060216616
- Publication date Sep 28, 2006
- Jang-Ho Shin
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having overlay measurement mark and method of...
- Publication number 20060131576
- Publication date Jun 22, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Cha-Won Koh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for aligning patterns on a substrate based on optical prope...
- Publication number 20060079067
- Publication date Apr 13, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Jang-Ho Shin
- H01 - BASIC ELECTRIC ELEMENTS

Jang-Ho Shin

Person

Patents Grantslast 30 patents

Apparatus and method for preprocessing security log

Semiconductor device having overlay measurement mark and method of...

Photomask for measuring lens aberration, method of its manufacture,...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR GENERATING SUMMARY OF URL FOR URL CLUSTERING

METHOD FOR MACHINE LEARNING OF MALICIOUS CODE DETECTING MODEL AND M...

APPARATUS AND METHOD FOR PREPROCESSING SECURITY LOG

OVERLAY MARK OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE INCLU...

Photomask for measuring lens aberration, method of its manufacture,...

Semiconductor device having overlay measurement mark and method of...

Methods for aligning patterns on a substrate based on optical prope...