Jang-Shiang Tsai

Person

Zhubei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,355,642
- Issue date Jun 7, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing pattern collapse
- Patent number 11,043,453
- Issue date Jun 22, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing pattern collapse
- Patent number 10,515,895
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor and method of forming the same
- Patent number 10,483,397
- Issue date Nov 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing pattern collapse
- Patent number 9,502,287
- Issue date Nov 22, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing a pattern collapse
- Patent number 9,153,479
- Issue date Oct 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor and method of forming the same
- Patent number 8,927,353
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for photoresist stripping and treatment of low-k dielectric...
- Patent number 7,598,176
- Issue date Oct 6, 2009
- Taiwan Semiconductor Manufacturing Co. Ltd.
- Jang-Shiang Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring low dielectric constant film properties during processing
- Patent number 7,400,401
- Issue date Jul 15, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jang-Shiang Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Low oxygen content photoresist stripping process for low dielectric...
- Patent number 7,029,992
- Issue date Apr 18, 2006
- Taiwan Semiconductor Manufacturing Company
- Jyu-Horng Shieh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method of Preventing Pattern Collapse
- Publication number 20200126913
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20200052122
- Publication date Feb 13, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Preventing Pattern Collapse
- Publication number 20170069573
- Publication date Mar 9, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Preventing Pattern Collapse
- Publication number 20160027688
- Publication date Jan 28, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD EFFECT TRANSISTOR AND METHOD OF FORMING THE SAME
- Publication number 20150137265
- Publication date May 21, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Preventing a Pattern Collapse
- Publication number 20140252625
- Publication date Sep 11, 2014
- Chih-Yuan Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FILLED EFFECT TRANSISTOR AND METHOD OF FORMING THE SAME
- Publication number 20080277745
- Publication date Nov 13, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Ju-Wang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLY SILICON HARD MASK
- Publication number 20080122107
- Publication date May 29, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Jang-Shiang Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring low dielectric constant film properties during processing
- Publication number 20060220653
- Publication date Oct 5, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jang-Shiang Tsai
- G01 - MEASURING TESTING
Information Patent Application
Method for photoresist stripping and treatment of low-k dielectric...
- Publication number 20060063386
- Publication date Mar 23, 2006
- Jang-Shiang Tsai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LOW OXYGEN CONTENT PHOTORESIST STRIPPING PROCESS FOR LOW DIELECTRIC...
- Publication number 20060040474
- Publication date Feb 23, 2006
- Jyu-Horng Shieh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jang-Shiang Tsai

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor structure

Method of preventing pattern collapse

Method of preventing pattern collapse

Fin field effect transistor and method of forming the same

Method of preventing pattern collapse

Method of preventing a pattern collapse

Fin field effect transistor and method of forming the same

Method for photoresist stripping and treatment of low-k dielectric...

Measuring low dielectric constant film properties during processing

Low oxygen content photoresist stripping process for low dielectric...

Patents Applicationslast 30 patents

Method of Preventing Pattern Collapse

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

Method of Preventing Pattern Collapse

Method Of Preventing Pattern Collapse

FIN FIELD EFFECT TRANSISTOR AND METHOD OF FORMING THE SAME

Method of Preventing a Pattern Collapse

FIN FILLED EFFECT TRANSISTOR AND METHOD OF FORMING THE SAME

POLY SILICON HARD MASK

Measuring low dielectric constant film properties during processing

Method for photoresist stripping and treatment of low-k dielectric...

LOW OXYGEN CONTENT PHOTORESIST STRIPPING PROCESS FOR LOW DIELECTRIC...