Jang Sup Yoon

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Gainesville, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
System, device, and method for embedded S-parameter measurement
- Patent number 7,924,025
- Issue date Apr 12, 2011
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- G01 - MEASURING TESTING
Information Patent Grant
Power detector of embedded IC test circuits
- Patent number 7,925,229
- Issue date Apr 12, 2011
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Embedded IC test circuits and methods
- Patent number 7,379,716
- Issue date May 27, 2008
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
EMBEDDED IC TEST CIRCUITS AND METHODS
- Publication number 20090005103
- Publication date Jan 1, 2009
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System, Device, and Method for Embedded S-Parameter Measurement
- Publication number 20080191712
- Publication date Aug 14, 2008
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- G01 - MEASURING TESTING
Information Patent Application
Embedded IC test circuits and methods
- Publication number 20060217085
- Publication date Sep 28, 2006
- University of Florida Research Foundation, Inc.
- William R. Eisenstadt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE