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Seoul, KR
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last 30 patents
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Patent Grant
Spectroscopic measuring apparatus and method, and method for fabric...
Patent number
11,320,259
Issue date
May 3, 2022
Samsung Electronics Co., Ltd.
Kwangrak Kim
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
FOCUS CONTROL METHOD FOR SPECTROSCOPIC MEASURING APPARATUS, INSPECT...
Publication number
20240060907
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Youngsun Choi
G02 - OPTICS
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Patent Application
SPECTROSCOPIC MEASURING APPARATUS AND METHOD, AND METHOD FOR FABRIC...
Publication number
20220049949
Publication date
Feb 17, 2022
Samsung Electronics Co., Ltd.
Kwangrak Kim
H01 - BASIC ELECTRIC ELEMENTS