Janice C. Lee

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Sequential circuit with error detection
- Patent number 10,024,916
- Issue date Jul 17, 2018
- Intel Corporation
- Keith A. Bowman
- G01 - MEASURING TESTING
Information Patent Grant
Sequential circuit with error detection
- Patent number 9,594,625
- Issue date Mar 14, 2017
- Intel Corporation
- Keith A. Bowman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sequential circuit with error detection
- Patent number 9,189,014
- Issue date Nov 17, 2015
- Intel Corporation
- Keith A. Bowman
- G01 - MEASURING TESTING
Information Patent Grant
Sequential circuit with error detection
- Patent number 8,301,970
- Issue date Oct 30, 2012
- Intel Corporation
- Keith Bowman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Carbon nanotube fuse element
- Patent number 7,787,292
- Issue date Aug 31, 2010
- Intel Corporation
- Ali Keshavarzi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEQUENTIAL CIRCUIT WITH ERROR DETECTION
- Publication number 20170139006
- Publication date May 18, 2017
- Intel Corporation
- Keith A. Bowman
- G01 - MEASURING TESTING
Information Patent Application
SEQUENTIAL CIRCUIT WITH ERROR DETECTION
- Publication number 20160034338
- Publication date Feb 4, 2016
- Intel Corporation
- Keith A. Bowman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sequential Circuit with Error Detection
- Publication number 20140122947
- Publication date May 1, 2014
- Keith A. Bowman
- G01 - MEASURING TESTING
Information Patent Application
Sequential circuit with error detection
- Publication number 20100079184
- Publication date Apr 1, 2010
- Keith Bowman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Carbon nanotube fuse element
- Publication number 20090003028
- Publication date Jan 1, 2009
- Ali Keshavarzi
- G11 - INFORMATION STORAGE