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Janis A. Valdmanis
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Columbus, IN, US
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last 30 patents
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Patent Grant
Highly-doped P-type contact for high-speed, front-side illuminated...
Patent number
6,262,465
Issue date
Jul 17, 2001
Picometrix, Inc.
Steven L. Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electro-optic measurements of voltage waveforms on electrical condu...
Patent number
4,891,580
Issue date
Jan 2, 1990
American Telephone & Telegraph Co., AT&T Bell Laboratories
Janis A. Valdmanis
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for signal transmission and optical communications
Patent number
4,742,577
Issue date
May 3, 1988
American Telephone and Telegraph Company, AT&T Bell Laboratories
Janis A. Valdmanis
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of electrical signals with subpicosecond resolution
Patent number
4,618,819
Issue date
Oct 21, 1986
The University of Rochester
Gerard Mourou
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of electrical signals with picosecond resolution
Patent number
4,446,425
Issue date
May 1, 1984
The University of Rochester
Janis A. Valdmanis
G01 - MEASURING TESTING
Information
Patent Grant
Electron-optical wide band signal measurement system
Patent number
4,434,399
Issue date
Feb 28, 1984
The University of Rochester
Gerard Mourou
G01 - MEASURING TESTING