January Kister

Person

Redwood City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bundled probe apparatus for multiple terminal contacting
- Patent number 7,064,564
- Issue date Jun 20, 2006
- Antares conTech, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Continuously profiled probe beam
- Patent number D510043
- Issue date Sep 27, 2005
- K&S Interconnect, Inc.
- January Kister
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Straight protruding probe beam contour surfaces
- Patent number D507198
- Issue date Jul 12, 2005
- K&S Interconnect, Inc.
- January Kister
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Interface structure for contacting probe beams
- Patent number 6,570,396
- Issue date May 27, 2003
- Kulicke & Soffa Investment, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a probe apparatus for testing integrated circuits
- Patent number 6,530,148
- Issue date Mar 11, 2003
- Kulicke & Soffa Investments, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Modular probe apparatus
- Patent number 6,525,552
- Issue date Feb 25, 2003
- Kulicke & Soffa Investments, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus having removable beam probes
- Patent number 6,424,164
- Issue date Jul 23, 2002
- Kulicke & Soffa Investment, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Modulated space transformer for high density buckling beam probe an...
- Patent number 6,420,887
- Issue date Jul 16, 2002
- Kulicke & Soffa Investment, Inc.
- January Kister
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE CONTACT PROBES
- Publication number 20150192615
- Publication date Jul 9, 2015
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Fine pitch guided vertical probe array having enclosed probe flexures
- Publication number 20120194212
- Publication date Aug 2, 2012
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical guided probe array providing sideways scrub motion
- Publication number 20090102495
- Publication date Apr 23, 2009
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Low profile probe having improved mechanical scrub and reduced cont...
- Publication number 20080265873
- Publication date Oct 30, 2008
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe cards employing probes having retaining portions for potting...
- Publication number 20080088327
- Publication date Apr 17, 2008
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe skates for electrical testing of convex pad topologies
- Publication number 20080001613
- Publication date Jan 3, 2008
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probes with self-cleaning blunt skates for contacting conductive pads
- Publication number 20080001612
- Publication date Jan 3, 2008
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Knee probe having increased scrub motion
- Publication number 20070152686
- Publication date Jul 5, 2007
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probe with dual plane fixture and probe apparatus therewith
- Publication number 20060006887
- Publication date Jan 12, 2006
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE ACTING SPRING PROBE
- Publication number 20060001437
- Publication date Jan 5, 2006
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Freely deflecting knee probe with controlled scrub motion
- Publication number 20050258844
- Publication date Nov 24, 2005
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Modular probe apparatus
- Publication number 20020167328
- Publication date Nov 14, 2002
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Bundled probe apparatus for multiple terminal contacting
- Publication number 20020101248
- Publication date Aug 1, 2002
- January Kister
- G01 - MEASURING TESTING

January Kister

Person

Patents Grantslast 30 patents

Bundled probe apparatus for multiple terminal contacting

Continuously profiled probe beam

Straight protruding probe beam contour surfaces

Interface structure for contacting probe beams

Method for making a probe apparatus for testing integrated circuits

Modular probe apparatus

Probe apparatus having removable beam probes

Modulated space transformer for high density buckling beam probe an...

Patents Applicationslast 30 patents

MULTIPLE CONTACT PROBES

Fine pitch guided vertical probe array having enclosed probe flexures

Vertical guided probe array providing sideways scrub motion

Low profile probe having improved mechanical scrub and reduced cont...

Probe cards employing probes having retaining portions for potting...

Probe skates for electrical testing of convex pad topologies

Probes with self-cleaning blunt skates for contacting conductive pads

Knee probe having increased scrub motion

Cantilever probe with dual plane fixture and probe apparatus therewith

DOUBLE ACTING SPRING PROBE

Freely deflecting knee probe with controlled scrub motion

Modular probe apparatus

Bundled probe apparatus for multiple terminal contacting