Janusz Bogdanowicz

Person

Brussel, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for differential heating of elongate nano-scaled structures
- Patent number 10,014,178
- Issue date Jul 3, 2018
- Imec VZW
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the doping profile of a partially activated...
- Patent number 8,817,262
- Issue date Aug 26, 2014
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the active doping concentration of a doped s...
- Patent number 8,717,570
- Issue date May 6, 2014
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining an active dopant concentration profile
- Patent number 8,634,080
- Issue date Jan 21, 2014
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the junction depth of a semico...
- Patent number 8,384,904
- Issue date Feb 26, 2013
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method and device to quantify active carrier profiles in ultra-shal...
- Patent number 7,751,035
- Issue date Jul 6, 2010
- IMEC
- Trudo Clarysse
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Measuring a Lateral Depth in a Microstructure
- Publication number 20220018781
- Publication date Jan 20, 2022
- IMEC vzw
- Thomas Nuytten
- G01 - MEASURING TESTING
Information Patent Application
Method for Differential Heating of Elongate Nano-Scaled Structures
- Publication number 20170178910
- Publication date Jun 22, 2017
- IMEC vzw
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...
- Publication number 20130335744
- Publication date Dec 19, 2013
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING AN ACTIVE DOPANT PROFILE
- Publication number 20130194577
- Publication date Aug 1, 2013
- Katholieke Universiteit Leuven
- Janusz BOGDANOWICZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE ACTIVE DOPING CONCENTRATION OF A DOPED S...
- Publication number 20130155409
- Publication date Jun 20, 2013
- Katholieke Universiteit Leuven
- Janusz BOGDANOWICZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE JUNCTION DEPTH OF A SEMICO...
- Publication number 20100238449
- Publication date Sep 23, 2010
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...
- Publication number 20100002236
- Publication date Jan 7, 2010
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE TO QUANTIFY ACTIVE CARRIER PROFILES IN ULTRA-SHAL...
- Publication number 20080224036
- Publication date Sep 18, 2008
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Trudo Clarysse
- G01 - MEASURING TESTING

Janusz Bogdanowicz

Person

Patents Grantslast 30 patents

Method for differential heating of elongate nano-scaled structures

Method for determining the doping profile of a partially activated...

Method for determining the active doping concentration of a doped s...

Method for determining an active dopant concentration profile

Method and apparatus for determining the junction depth of a semico...

Method and device to quantify active carrier profiles in ultra-shal...

Patents Applicationslast 30 patents

Method and Apparatus for Measuring a Lateral Depth in a Microstructure

Method for Differential Heating of Elongate Nano-Scaled Structures

METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...

METHOD FOR DETERMINING AN ACTIVE DOPANT PROFILE

METHOD FOR DETERMINING THE ACTIVE DOPING CONCENTRATION OF A DOPED S...

METHOD AND APPARATUS FOR DETERMINING THE JUNCTION DEPTH OF A SEMICO...

METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...

METHOD AND DEVICE TO QUANTIFY ACTIVE CARRIER PROFILES IN ULTRA-SHAL...