Jared P. Yanofsky

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Somerville, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining thermal profiles of semiconductor structures
- Patent number 9,638,581
- Issue date May 2, 2017
- GLOBALFOUNDRIES Inc.
- Nicholas G. Clore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip carrier with dual-sided chip access and a method for testing a...
- Patent number 9,412,691
- Issue date Aug 9, 2016
- GLOBALFOUNDRIES Inc.
- Heather M. Truax
- G01 - MEASURING TESTING
Information Patent Grant
Methods of localized hardening of dicing channel by applying locali...
- Patent number 9,209,082
- Issue date Dec 8, 2015
- International Business Machines Corporation
- Matthew G. Bausch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microprocessor image correction and method for the detection of pot...
- Patent number 8,987,010
- Issue date Mar 24, 2015
- International Business Machines Corporation
- Stephen P. Ayotte
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHIP CARRIER WITH DUAL-SIDED CHIP ACCESS AND A METHOD FOR TESTING A...
- Publication number 20160163631
- Publication date Jun 9, 2016
- International Business Machines Corporation
- Heather M. Truax
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THERMAL PROFILES OF SEMICONDUCTOR STRUCTURES
- Publication number 20150362373
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Nicholas G. Clore
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF LOCALIZED HARDENING OF DICING CHANNEL
- Publication number 20150194346
- Publication date Jul 9, 2015
- International Business Machines Corporation
- Matthew G. Bausch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROPROCESSOR IMAGE CORRECTION AND METHOD FOR THE DETECTION OF POT...
- Publication number 20150064813
- Publication date Mar 5, 2015
- International Business Machines Corporation
- Stephen P. AYOTTE
- H01 - BASIC ELECTRIC ELEMENTS