Jaroslav JIRUSE

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Blansko, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Device with ion column and scanning electron microscope
- Patent number 10,535,496
- Issue date Jan 14, 2020
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method of use thereof
- Patent number 10,504,694
- Issue date Dec 10, 2019
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing or removing organic and inorganic contamination...
- Patent number 9,782,805
- Issue date Oct 10, 2017
- MASARYKOVA UNIVERZITA
- Pavel Stahel
- B08 - CLEANING
Information Patent Grant
Device for mass spectrometry
- Patent number 9,721,781
- Issue date Aug 1, 2017
- TESCAN Brno, s.r.o.
- Libor Sedlacek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Unknown
- Publication number 20190088445
- Publication date Mar 21, 2019
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Method of Use Thereof
- Publication number 20170338078
- Publication date Nov 23, 2017
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device for mass spectrometry
- Publication number 20170025264
- Publication date Jan 26, 2017
- TESCAN Brno, s.r.o.
- Libor Sedlacek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Raman microscope and electron microscope analytical system
- Publication number 20150279616
- Publication date Oct 1, 2015
- WITec GmbH
- Jaroslav Jiruse
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCING OR REMOVING ORGANIC AND INORGANIC CONTAMINATION...
- Publication number 20150209841
- Publication date Jul 30, 2015
- MASARYKOVA UNIVERZITA
- Pavel STAHEL
- B08 - CLEANING