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Jaroslaw Paluszynski
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Oberkochen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for avoiding artefacts during serial block face imaging
Patent number
9,536,704
Issue date
Jan 3, 2017
Carl Zeiss Microscopy GmbH
Matthias Langer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for operating a particle beam device and/or for analyzing an...
Patent number
9,035,247
Issue date
May 19, 2015
Carl Zeiss Microscopy GmbH
Jaroslaw Paluszynski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of processing of an object
Patent number
8,816,303
Issue date
Aug 26, 2014
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam microscope for generating material data
Patent number
8,766,219
Issue date
Jul 1, 2014
Carl Zeiss Microscopy GmbH
Michel Aliman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam microscope and method for operating the particle beam...
Patent number
8,487,252
Issue date
Jul 16, 2013
Carl Zeiss NTS GmbH
Simon Diemer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating a scanning electron microscope
Patent number
8,227,752
Issue date
Jul 24, 2012
Carl Zeiss NTS GmbH
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND/OR FOR ANALYZING AN...
Publication number
20140158884
Publication date
Jun 12, 2014
CARL ZEISS MICROSCOPY GMBH
Jaroslaw Paluszynski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR AVOIDING ARTEFACTS DURING SERIAL BLOCK FACE IMAGING
Publication number
20140092230
Publication date
Apr 3, 2014
Matthias Langer
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE BEAM MICROSCOPE FOR GENERATING MATERIAL DATA
Publication number
20140070099
Publication date
Mar 13, 2014
CARL ZEISS MICROSCOPY GMBH
Michel Aliman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Processing of an Object
Publication number
20120145895
Publication date
Jun 14, 2012
CARL ZEISS NTS GMBH
Josef BIBERGER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam Microscope and Method for Operating the Particle Beam...
Publication number
20120074317
Publication date
Mar 29, 2012
CARL ZEISS NTS GMBH
Simon Diemer
H01 - BASIC ELECTRIC ELEMENTS