Jason Arjavac

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
- Patent number 11,313,042
- Issue date Apr 26, 2022
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling TEM sample preparation
- Patent number 10,465,293
- Issue date Nov 5, 2019
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 9,852,750
- Issue date Dec 26, 2017
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,581,526
- Issue date Feb 28, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CAD-assisted TEM prep recipe creation
- Patent number 9,576,772
- Issue date Feb 21, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 9,349,570
- Issue date May 24, 2016
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,275,831
- Issue date Mar 1, 2016
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 8,993,962
- Issue date Mar 31, 2015
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample orientation
- Patent number 8,912,488
- Issue date Dec 16, 2014
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,890,064
- Issue date Nov 18, 2014
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
System and method for ex situ analysis of a substrate
- Patent number 8,884,247
- Issue date Nov 11, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating S/TEM sample and sample structure
- Patent number 8,525,137
- Issue date Sep 3, 2013
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,455,821
- Issue date Jun 4, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 8,357,913
- Issue date Jan 22, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 8,163,145
- Issue date Apr 24, 2012
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 7,611,610
- Issue date Nov 3, 2009
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Proximity deposition
- Patent number 6,926,935
- Issue date Aug 9, 2005
- FEI Company
- Jason Harrison Arjavac
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY
- Publication number 20230197403
- Publication date Jun 22, 2023
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...
- Publication number 20200095688
- Publication date Mar 26, 2020
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CAD-ASSISTED TEM PREP RECIPE CREATION
- Publication number 20170062178
- Publication date Mar 2, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20160163506
- Publication date Jun 9, 2016
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Sample Extraction and Handling
- Publication number 20150311034
- Publication date Oct 29, 2015
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
Method for S/TEM Sample Analysis
- Publication number 20150206707
- Publication date Jul 23, 2015
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Sample Oreintation
- Publication number 20140131572
- Publication date May 15, 2014
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Ex Situ Analysis of a Substrate
- Publication number 20140084157
- Publication date Mar 27, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Application
Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation
- Publication number 20140061032
- Publication date Mar 6, 2014
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20130341505
- Publication date Dec 26, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20130153785
- Publication date Jun 20, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...
- Publication number 20120199923
- Publication date Aug 9, 2012
- FEI Company
- JAMES P. NADEAU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20110006207
- Publication date Jan 13, 2011
- FEI COMPANY
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20100308219
- Publication date Dec 9, 2010
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20100305747
- Publication date Dec 2, 2010
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...
- Publication number 20100108506
- Publication date May 6, 2010
- FEI Company
- JAMES P. NADEAU
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for controlling topological variation on a mil...
- Publication number 20050103746
- Publication date May 19, 2005
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Application
Proximity deposition
- Publication number 20040261719
- Publication date Dec 30, 2004
- Jason Harrison Arjavac
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Jason Arjavac

Person

Patents Grantslast 30 patents

Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...

Dose-based end-pointing for low-kV FIB milling TEM sample preparation

Method and apparatus for controlling topographical variation on a m...

Method for S/TEM sample analysis

CAD-assisted TEM prep recipe creation

Method and apparatus for sample extraction and handling

Method for S/TEM sample analysis

Method and apparatus for sample extraction and handling

Automated sample orientation

Method for S/TEM sample analysis

System and method for ex situ analysis of a substrate

Method for creating S/TEM sample and sample structure

Method for S/TEM sample analysis

Method and apparatus for sample extraction and handling

Method and apparatus for controlling topographical variation on a m...

Method and apparatus for controlling topographical variation on a m...

Proximity deposition

Patents Applicationslast 30 patents

MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY

DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...

CAD-ASSISTED TEM PREP RECIPE CREATION

METHOD FOR S/TEM SAMPLE ANALYSIS

Method and Apparatus for Sample Extraction and Handling

Method for S/TEM Sample Analysis

Automated Sample Oreintation

System and Method for Ex Situ Analysis of a Substrate

Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation

METHOD FOR S/TEM SAMPLE ANALYSIS

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...

METHOD FOR S/TEM SAMPLE ANALYSIS

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...

Method and apparatus for controlling topological variation on a mil...

Proximity deposition