Jason Bemis

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 10,557,865
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research, Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,841,436
- Issue date Dec 12, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 9,696,342
- Issue date Jul 4, 2017
- Oxford Instruments AFM Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,453,857
- Issue date Sep 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,383,388
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 9,297,827
- Issue date Mar 29, 2016
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20170299628
- Publication date Oct 19, 2017
- Oxford Instruments AFM Inc
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20170131322
- Publication date May 11, 2017
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20160313369
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20160282384
- Publication date Sep 29, 2016
- Oxford Instruments AFM Inc
- Roger B Proksch
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20150309071
- Publication date Oct 29, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20150301080
- Publication date Oct 22, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Quantitative measurements using multiple frequency atomic force mic...
- Publication number 20130117895
- Publication date May 9, 2013
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY

Jason Bemis

Person

Patents Grantslast 30 patents

Automated optimization of AFM light source positioning

Automated optimization of AFM light source positioning

Quantitative measurements using multiple frequency atomic force mic...

AM/FM measurements using multiple frequency atomic force microscopy

Automated atomic force microscope and the operation thereof

AM/FM measurements using multiple frequency of atomic force microscopy

Quantitative measurements using multiple frequency atomic force mic...

AM/FM measurements using multiple frequency of atomic force microscopy

Automated atomic force microscope and the operation thereof

Quantitative measurements using multiple frequency atomic force mic...

Patents Applicationslast 30 patents

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Automated Atomic Force Microscope and the Operation Thereof

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Automated Atomic Force Microscope and the Operation Thereof

Quantitative measurements using multiple frequency atomic force mic...