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Jason Brian Fascinato
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Cincinnati, OH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for inspecting dovetail edgebreak contour
Patent number
7,317,992
Issue date
Jan 8, 2008
General Electric Company
Jason Brian Fascinato
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for fixtured wax and trace
Patent number
6,997,046
Issue date
Feb 14, 2006
General Electric Company
Jason Brian Fascinato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for inspecting dovetail edgebreak contour
Publication number
20050283334
Publication date
Dec 22, 2005
Jason Brian Fascinato
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for fixtured wax and trace
Publication number
20050022410
Publication date
Feb 3, 2005
Jason Brian Fascinato
G01 - MEASURING TESTING