Jason Cleveland

Person

Ventura, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of detecting a leak from a subarray of a microarray chip, k...
- Patent number 12,134,798
- Issue date Nov 5, 2024
- Somalogic Operating Co., Inc.
- Rachel Woolaver Trahan
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method for conducting uniform reactions
- Patent number 12,064,769
- Issue date Aug 20, 2024
- Somalogic Operating Co., Inc.
- Jason Paul Cleveland
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Proteomic assay using quantum sensors
- Patent number 11,698,373
- Issue date Jul 11, 2023
- Somalogic Operating Co., Inc.
- Jason Paul Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
Proteomic assay using quantum sensors
- Patent number 11,249,080
- Issue date Feb 15, 2022
- SomaLogic, Inc.
- Jason Paul Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,705,114
- Issue date Jul 7, 2020
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Proteomic assay using quantum sensors
- Patent number 10,481,155
- Issue date Nov 19, 2019
- SomaLogic, Inc.
- Jason Paul Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 10,337,890
- Issue date Jul 2, 2019
- Oxford Instruments AFM Inc.
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,338,096
- Issue date Jul 2, 2019
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 10,107,832
- Issue date Oct 23, 2018
- Oxford Instruments PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 10,054,612
- Issue date Aug 21, 2018
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 9,804,193
- Issue date Oct 31, 2017
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 9,689,890
- Issue date Jun 27, 2017
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 9,518,814
- Issue date Dec 13, 2016
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,383,388
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 9,383,386
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,097,737
- Issue date Aug 4, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Nanoindenter
- Patent number 9,063,042
- Issue date Jun 23, 2015
- Oxford Instruments PLC
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,925,376
- Issue date Jan 6, 2015
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated micro actuator and IVDT for high precision position meas...
- Patent number 8,502,525
- Issue date Aug 6, 2013
- Oxford Instruments PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Digital Q control for enhanced measurement capability in cantilever...
- Patent number 8,459,102
- Issue date Jun 11, 2013
- Oxford Instruments PLC
- Dan Bocek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope
- Patent number 8,370,960
- Issue date Feb 5, 2013
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,205,488
- Issue date Jun 26, 2012
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 8,196,458
- Issue date Jun 12, 2012
- Asylum Research Corporation
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Digital Q control for enhanced measurement capability in cantilever...
- Patent number 8,042,383
- Issue date Oct 25, 2011
- Asylum Research Corporation
- Dan Bocek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 7,937,991
- Issue date May 10, 2011
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 7,685,869
- Issue date Mar 30, 2010
- Asylum Research Corporation
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
- Publication number 20230349896
- Publication date Nov 2, 2023
- SomaLogic Operating Co., Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONDUCTING UNIFORM REACTIONS
- Publication number 20230191414
- Publication date Jun 22, 2023
- SomaLogic Operating Co., Inc.
- Jason Paul CLEVELAND
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
- Publication number 20220170927
- Publication date Jun 2, 2022
- SomaLogic, Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
FORCE BASED SEQUENCING OF BIOPOLYMERS
- Publication number 20200216892
- Publication date Jul 9, 2020
- Lab79 Technologies, Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
- Publication number 20200081001
- Publication date Mar 12, 2020
- SomaLogic, Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20190324054
- Publication date Oct 24, 2019
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
- Publication number 20190277842
- Publication date Sep 12, 2019
- SomaLogic, Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20180128853
- Publication date May 10, 2018
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20170292971
- Publication date Oct 12, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20170254834
- Publication date Sep 7, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20170168089
- Publication date Jun 15, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20170089733
- Publication date Mar 30, 2017
- OXFORD INSTRUMENTS PLC
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20160313369
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Optical Beam Positioning Unit for Atomic Force Microscope
- Publication number 20160313368
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20160169937
- Publication date Jun 16, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20150338438
- Publication date Nov 26, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20150301080
- Publication date Oct 22, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular atomic force microscope with environmental controls
- Publication number 20150150163
- Publication date May 28, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20150113687
- Publication date Apr 23, 2015
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE
- Publication number 20140317790
- Publication date Oct 23, 2014
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20140223612
- Publication date Aug 7, 2014
- ASYLUM CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20130314078
- Publication date Nov 28, 2013
- OXFORD INSTRUMENTS AFM INC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Nanoindenter
- Publication number 20120272411
- Publication date Oct 25, 2012
- ASYLUM RESEARCH CORPORATION
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20120266336
- Publication date Oct 18, 2012
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Digital Q control for enhanced measurement capability in cantilever...
- Publication number 20120216322
- Publication date Aug 23, 2012
- ASYLUM RESEARCH CORPORATION
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20100333240
- Publication date Dec 30, 2010
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular atomic force microscope
- Publication number 20100275334
- Publication date Oct 28, 2010
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Integrated micro actuator and lVDT for high precision position meas...
- Publication number 20100213930
- Publication date Aug 26, 2010
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Nanoindenter
- Publication number 20100180356
- Publication date Jul 15, 2010
- ASYLUM RESEARCH CORPORATION
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING

Jason Cleveland

Person

Patents Grantslast 30 patents

Methods of detecting a leak from a subarray of a microarray chip, k...

Method for conducting uniform reactions

Metrological scanning probe microscope

Proteomic assay using quantum sensors

Proteomic assay using quantum sensors

Metrological scanning probe microscope

Proteomic assay using quantum sensors

Modular atomic force microscope with environmental controls

Integrated micro actuator and LVDT for high precision position meas...

Metrological scanning probe microscope

Fully digitally controller for cantilever-based instruments

Optical beam positioning unit for atomic force microscope

Automated atomic force microscope and the operation thereof

Metrological scanning probe microscope

Fully digitally controller for cantilever-based instruments

Modular atomic force microscope with environmental controls

Integrated micro actuator and LVDT for high precision position meas...

Automated atomic force microscope and the operation thereof

Optical beam positioning unit for atomic force microscope

Modular atomic force microscope with environmental controls

Nanoindenter

Fully digitally controller for cantilever-based instruments

Integrated micro actuator and IVDT for high precision position meas...

Digital Q control for enhanced measurement capability in cantilever...

Modular atomic force microscope

Fully digitally controller for cantilever-based instruments

Nanoindenter

Digital Q control for enhanced measurement capability in cantilever...

Fully digitally controller for cantilever-based instruments

Nanoindenter

Patents Applicationslast 30 patents

PROTEOMIC ASSAY USING QUANTUM SENSORS

METHOD FOR CONDUCTING UNIFORM REACTIONS

PROTEOMIC ASSAY USING QUANTUM SENSORS

FORCE BASED SEQUENCING OF BIOPOLYMERS

PROTEOMIC ASSAY USING QUANTUM SENSORS

Metrological Scanning Probe Microscope

PROTEOMIC ASSAY USING QUANTUM SENSORS

SCANNING PROBE MICROSCOPE

Metrological Scanning Probe Microscope

Fully Digitally Controller for Cantilever-Based Instruments

Modular Atomic Force Microscope

Modular Atomic Force Microscope with Environmental Controls

Integrated Micro Actuator and LVDT for High Precision Position Meas...

Automated Atomic Force Microscope and the Operation Thereof

Optical Beam Positioning Unit for Atomic Force Microscope

Metrological Scanning Probe Microscope

Modular Atomic Force Microscope with Environmental Controls

Automated Atomic Force Microscope and the Operation Thereof

Modular atomic force microscope with environmental controls

Fully Digitally Controller for Cantilever-Based Instruments

OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE

Modular Atomic Force Microscope

Integrated Micro Actuator and LVDT for High Precision Position Meas...

Nanoindenter

Fully Digitally Controller for Cantilever-Based Instruments

Digital Q control for enhanced measurement capability in cantilever...

Fully Digitally Controller for Cantilever-Based Instruments

Modular atomic force microscope

Integrated micro actuator and lVDT for high precision position meas...

Nanoindenter