Jason E. Doege

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 7,114,114
- Issue date Sep 26, 2006
- INOVYS Corporation
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 7,013,417
- Issue date Mar 14, 2006
- INOVYS Corporation
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
- Patent number 6,880,137
- Issue date Apr 12, 2005
- Inovys
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Scan based testing of an integrated circuit for compliance with tim...
- Patent number 5,812,561
- Issue date Sep 22, 1998
- Motorola, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for delay defect location when testing digital se...
- Publication number 20050203716
- Publication date Sep 15, 2005
- Inovys Corporation
- Donald V. Organ
- G06 - COMPUTING CALCULATING COUNTING