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Jason F. Hiltner
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Corning, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Inspection of transparent substrates for defects
Patent number
7,215,418
Issue date
May 8, 2007
Corning Incorporated
Kevin T. Gahagan
G01 - MEASURING TESTING
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Patent Grant
Inspection of transparent substrates for defects
Patent number
7,142,295
Issue date
Nov 28, 2006
Corning Incorporated
Kevin T. Gahagan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Inspection of transparent substrates for defects
Publication number
20060192952
Publication date
Aug 31, 2006
Kevin T. Gahagan
G01 - MEASURING TESTING
Information
Patent Application
Inspection of transparent substrates for defects
Publication number
20040174519
Publication date
Sep 9, 2004
Kevin T. Gahagan
G01 - MEASURING TESTING